Atom probe tomography (APT) is a cutting-edge microscopy technique that delivers three-dimensional compositional maps at sub-nanometre resolution. By employing field evaporation and time‐of‐flight ...

All matter is made of very small units called atoms. Atoms are so small they cannot be seen using a regular microscope. Scientists have discovered a way to “see” atoms using a special instrument ...

Researchers have developed a new software package for analyzing images from electron and scanning probe microscopy. The package, AtomAI, uses deep learning. This is a type of machine learning that ...

This study discusses atom probe tomography (APT) and the feasibility of using a novel script-controlled focused ion beam-scanning electron microscopy (FIB-SEM) system for tip fabrication to improve ...

Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Introduction to SNOM: The Scanning Near-field Optical Microscope (SNOM) stands as a pivotal analytical tool in nanotechnology, enabling the visualization of nanostructures with resolution beyond the ...

One variation of electron microscopy is transmission electron microscopy (TEM). In a TEM experiment, the electron beam passes through the sample and the electrons are directly imaged onto an electron ...