Why isolated flows negatively impact design schedule and PPA. Benefits of unified DFT, synthesis, and physical design flows. Physical implementation optimization methods for test compression and scan ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Over the last few years, design-for-test (DFT) chip-testing techniques such as internal scan (ISCAN), automatic test-pattern generation (ATPG), built-in self-test (BIST), and boundary scan (BSCAN) ...

In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...

The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.

The purpose of electronic design automation (EDA) software is to solve SoC design problems and simplify the entire process. For design for test (DFT), this means aiming to streamline the DFT ...

As the challenges of network execution time reach new heights, the question of integrating synthesis and design-for-test (DFT) in the fabrication of high density networking devices merits reassessment ...

To meet the increasing size of ICs, required to accommodate the integration of billions of transistors in order to deliver the performance required for tasks such as AI and autonomous vehicles, Mentor ...

Some hardware DFT techniques have parallels in software DFT. For example, build special test circuitry (analogously, test code) into the system, reduce the size of state space by decomposing logic ...