Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...

The physical properties of the layer structure being analyzed are included in the measured ellipsometric parameters (Ψ and Δ). This information exhibits the layer thickness and refractive index ...

By combining two fundamentally different microscopy techniques, researchers can now measure the optical properties of a ...

Block diagram of Faraday effect measurement system using dual-comb spectroscopy. The signal comb (red line) passes through the sample and is superposed with the local comb (blue line). The vertical ...