Semiconductor Engineering

Wafer-Level Test Infrastructure for Higher Parallel Wafer Level Testing of SoC

A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne. ...
Nasdaq

Teradyne Announces Production System for Double-Sided Wafer Probe Test for Silicon Photonics

NORTH READING, Mass.--(BUSINESS WIRE)-- Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, ...
Nasdaq

Aehr Test Systems secures multi-wafer test, burn-in production system order

Aehr Test Systems (AEHR) has received an initial production order from a top tier automotive semiconductor supplier for a FOX-XP wafer level test and burn-in system with fully integrated FOX WaferPak ...
Business Wire

Keysight Unveils 3kV High Voltage Wafer Test System for Power Semiconductors

Increased productivity and efficiency with one-pass test enabled by a high-voltage switching matrix Designed to enhance the safety of operators and equipment; complies with regulations SANTA ROSA, ...
Semiconductor Engineering

Hunting For Macro Defects

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
Business Wire

Keysight’s New Parallel Parametric Test System Delivers High Throughput and Cost-Effective Wafer Test

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
EDN

Vitesse completes InP test wafers for 40-Gbit parts

CAMARILLO, Calif. — Vitesse Semiconductor Corp. has manufactured test wafers in a heterojunction bipolar transistor (HBT) indium phosphide process on its 4-inch manufacturing line. The wafers, which ...
AZoNano

PI Introduces Miniaturized Alignment Engine Platform for Scalable, Parallel E/O Wafer-Level Test

Parallel piezo aligners with fly height sensors enable faster PIC wafer testing. Parallel miniaturized piezoelectric alignment engines with fly-height sensors enable faster PIC wafer testing. Image ...
The Business Journals

Intel confirms advanced silicon wafer tests underway in Arizona

To continue reading this content, please enable JavaScript in your browser settings and refresh this page. Preview this article 1 min Intel Corp. confirmed initial ...
Seeking Alpha

Aehr Receives Volume Production Order for WaferPak Full Wafer Contactors from Major Silicon Carbide Semiconductor Customer for Test and Burn-in of Silicon Carbide Semiconductor ...

FREMONT, Calif., March 21, 2023 (GLOBE NEWSWIRE) -- Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and reliability qualification equipment, today announced it has received an ...
KXAN

Global Wafer Test Probe Card Market to reach USD 3.88 billion by 2028

New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED STATES, November 30 ...