What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...
This study is led by Dr. Vijay Venkatesh (Department of Mechanical and Aerospace Engineering, The Ohio State University). Characterization of transmembrane ion transport through porous substrates at ...
Microscopy with the aid of electric fields A special ion microscope made this observation possible. It was developed, build and commissioned by the researches at the 5 th Physical Institute in close ...
Zeiss Microscopy, Jena, Germany, a manufacturer of visible, electron, X-ray and ion microscope systems, has added two super-resolution microscopes to its structured illumination microscopy (SIM) range ...
Improving the capacitance of supercapacitors requires gaining control over ion behavior inside carbon nanopores. This study ...
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Laser-based technologies have played their part in the refinement of lithium-ion batteries and enhancement of battery performance, such as the use of lasers to cut the electrodes used in the ...
Compact electron probes with large beam currents are required to achieve such precision. Routine production at the nanoscale requires immaculate and regulated surfaces to get the appropriate ...
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