Decreased system reliability due to overloaded power supplies is a common engineering challenge. In this Q&A-style article submitted by Allied Electronic & Automation, David Norton, technical ...

Reliability testing has long served as a method of ensuring that semiconductor devices maintain their desired performance over a given lifetime. As IC manufacturers continue to introduce new and ...

In today’s world, so-called “high-performance, sustainable” facilities are a dime a dozen. But many of these buildings rely on overly complex mechanical systems to carry out their mission. While these ...

Vertical-cavity surface-emitting laser (VCSEL)-based parallel optical interconnects are becoming vital components of communications systems for which short distance (less than 300 meters) and high ...

At the core of every electronics system is a chip that has to meet multiple conflicting requirements such as increased functionality, best power efficiency, highest reliability, lowest design cost and ...

One of the great benefits of adopting the Lustre* parallel file system in any environment—HPC or enterprise—is that it’s an open source project with a deep and broad user community in front of it and ...

Reliability testing has long served as a method of ensuring that semiconductor devices maintain their desired performance over a given lifetime. As IC manufacturers continue to introduce new and ...