Abstract: Surface defect detection of metal sheets is an important link in industrial production. Identifying and locating defects on the surface of metal sheets is important to ensure safely ...
Abstract: Grain growth of Cu interconnects in a low-k dielectric was achieved at an elevated anneal temperature of 300 °C without stress-migration-related reliability problems. For this, a TaN metal ...
Add Yahoo as a preferred source to see more of our stories on Google. We all recognize smoke alarms and sirens, but according to Reddit, there are plenty of other sounds that should make you stop in ...
Optoelectronic Materials Section, Department of Chemical Engineering, Delft University of Technology, Van der Maasweg 9, 2629 HZ, Delft, The Netherlands ...
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