Abstract: Characterizing variability and aging in CMOS circuits, such as ring oscillators (ROs), typically requires specialized laboratory equipment, including costly instrumentation and wafer probers ...
Abstract: This article reports a 1-Tb 3-b/cell 3-D flash memory fabricated with CMOS direct bonded array (CBA) technology. Compaction of circuits and wires achieves the highest bit density in the ...
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