Microwaves & RF

Conductive RF Test Environments Boost Confidence in UE, SoC, and Chipset Designs

From 5G deployments to Wi-Fi 6E to expanding IoT infrastructure, engineers must design SoCs, chipsets, and user equipment ...
EDN

A brief introduction of RF test chambers and ranges

It is often necessary to provide some type of shielding in order to perform RF/wireless testing with an acceptable amount of external noise. It is also often necessary to perform testing where the ...
Electronic Design

Tackling Next-Generation RF SOC Test

Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...
Semiconductor Engineering

Meeting The Challenges Of 5G RF Production Test Services

Implementation of the 5G radio frequency (RF) standard is increasing rapidly [1]. Over the past four to six quarters, there has been an increased focus on publications and products that have been ...
Semiconductor Engineering

2025-Product Design Enhancement With Test Structures For Non-Contact Detection Of Yield Detractors

Detection and monitoring of the yield loss mechanisms and defects in product chips have been a subject of extensive efforts, resulting in multiple useful Design-for-Manufacturing (DFM) and ...
Electronic Design

Next-Generation RF Device Test Performance Challenges

This is the second article of a three-part series discussing the likely impacts of next-generation consumer wireless semiconductor devices on instrumentation performance requirements. The first ...