Abstract: Device scaling in advanced CMOS nodes is becoming more difficult due to patterning limitations and complex 3-D transistor integration schemes. This also makes the devices more sensitive to ...
Abstract: Hot carrier injection (HCI) has been strategically leveraged to enhance the stability of SRAM physically unclonable functions (PUFs). Since the effects of HCI are not constant, exhibiting ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results