A few weeks ago I was working with Trent McConaghy of Solido Design Automation on a paper for the EDA Designline “High-yield, high-performance memory design”. Not only was that a very popular article, ...
As technology nodes shrink to 90 nanometers and below, chips become much more difficult to manufacture. In-die process variations increase substantially at 90 nm — even more at 65 nm. If these effects ...
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